IEEE - Institute of Electrical and Electronics Engineers, Inc. - Layer-by-layer photoluminescence and photoreflectance analysis of impurity distribution in HgCdTe

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Xiang Lu ; Jun Shao ; Yanfeng Wei ; Jianrong Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5613074
Regular:

Layer-by-layer infrared photoluminescence and photoreflectance measurements are performed on an HgCdTe epliayer. The Cd composition and impurity states along the growth direction are examined, and... View More

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