IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scattering near-field microscopy in the THz region using a free-electron laser

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): von Ribbeck, H.-G. ; Wenzel, M.T. ; Jacob, R. ; Eng, L.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5613022
Regular:

We present scattering-type scanning near-field optical micro-spectroscopy (s-SNOM) investigations successfully operated in the THz range with a wavelength independent spatial resolution of <... View More

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