IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pump and probe THz emission microscope

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Tonouchi, M. ; Fujiwara, S. ; Kaneko, D. ; Kawayama, I. ; Murakami, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5613019
Regular:

Pump and probe THz emission microscope has been developed with a special resolution of less than 1 µm, and applied for the study of dynamic response of photoconductive antennas made of SI-GaAs,... View More

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