IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resonance detection of terahertz radiation in nanometer field-effect transistors with two-dimensional electron gas

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Maremyanin, K.V. ; Gavrilenko, V.I. ; Morozov, S.V. ; Ermolaev, D.M. ; Zemlyakov, V.E. ; Shapoval, S.Yu. ; Fateev, D.V. ; Popov, V.V. ; Maleev, N.A. ; Teppe, F. ; Knap, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5613007
Regular:

Resonance detection of terahertz radiation by nanometer field-effect transistors GaAs/AlGaAs and transistor structure GaAs/InGaAs with large area slit grating gate has been measured. For these... View More

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