IEEE - Institute of Electrical and Electronics Engineers, Inc. - High resolution measurements to determine the permittivity in artificial structures

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Krebs, C. ; Rubart, J. ; Hommes, A. ; Brauns, R. ; Nüssler, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5613004
Regular:

The characterization of materials is one major task for systems which work e.g. in the field of quality or production control. One factor to analyze material volume information is the... View More

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