IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sub-terahertz imaging with AlGaN/GaN MISFETs

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Nadar, S. ; Klimenko, O. ; Videlier, H. ; Coquillat, D. ; Dyakonova, N. ; Teppe, F. ; Knap, W. ; Madjour, K. ; Ducournau, G. ; Gaquière, C. ; Poisson, M.A. ; Torres, J. ; Szczytko, J. ; Dobroiu, A. ; Otani, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5612996
Regular:

We evaluate the optical performance of AlGaN/GaN MISFETs as a non-resonant sub-terahertz, room temperature detector. The single-pixel responsivity and the noise equivalent power are determined.... View More

Advertisement