IEEE - Institute of Electrical and Electronics Engineers, Inc. - Non-destructive inspection of opaque objects with a 3D millimeter-wave tomographic scanner

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Younus, A. ; Salort, S. ; Caumes, J.-P. ; Desbarats, P. ; Mounaix, P. ; Abraham, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5612989
Regular:

Flexible monochromatic millimeter wave system coupled with an infrared temperature sensor demonstrates large size 3D visualization of manufactured opaque phantoms with different refractive index... View More

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