IEEE - Institute of Electrical and Electronics Engineers, Inc. - Volumetric analyses using terahertz-tomography techniques

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Brahm, A. ; Kunz, M. ; Riehemann, S. ; Notni, G. ; Tünnermann, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5612868
Regular:

We report about an algorithmic approach to identify substances inside a sample using their complete characteristic absorption spectra from a tomographic measurement with ultrashort THz-pulses.... View More

Advertisement