IEEE - Institute of Electrical and Electronics Engineers, Inc. - THz — A critical analysis of applications and compact device source technologies: Challenges, opportunities, and common truths

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Armstrong, C.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5612746
Regular:

The results of an analysis of THz applications and source device physics will be presented. This work was performed in support of a US government review on Compact THz Sources held in 2007.... View More

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