IEEE - Institute of Electrical and Electronics Engineers, Inc. - Near-infrared spectroscopy for non-destructive coating analysis calibrated by Terahertz Pulsed Imaging

2010 35th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2010)

Author(s): Shuncong Zhong ; Yaochun Shen ; Hao Shen ; Evans, M.J. ; May, R.K. ; Zeitler, J.A. ; Warr, I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Rome, Italy, Italy
Conference Date: 5 September 2010
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6656-6
ISBN (Electronic): 978-1-4244-6657-3
ISBN (Paper): 978-1-4244-6655-9
DOI: 10.1109/ICIMW.2010.5612668
Regular:

Near-infrared (NIR) spectroscopy is a versatile technique for non-destructive analysis of pharmaceutical tablet coating thickness; however, it needs a calibration model and thus the prior... View More

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