IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization and modeling of second breakdown in NMOST's for the extraction of ESD-related process and design parameters

Author(s): A. Amerasekera ; L. van Roozendaal ; J. Bruines ; F. Kuper
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1991
Volume: 38
Page Count: 8
Page(s): 2,161 - 2,168
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/16.83744
Regular:

A technique is presented to determine the effective process and design-related parameters from the high-current I-Vcharacteristics of NMOSTs, for use in the development of electrostatic discharge... View More

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