IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tool wear states recognition based on genetic algorithm and back propagation neural network model

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Weilin Li ; Pan Fu ; Weiqing Cao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 10
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622804
Regular:

The recognition model of tool wear states based on genetic algorithm and back propagation (BP) network is proposed. There are some disadvantages in BP algorithm, such as low rate of convergence,... View More

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