IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new testability model of electronic system and its application

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Ma Fei ; Song Dong ; Wang Chuanqing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 10
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622680
Regular:

Testability is an important design feature of systems and equipment. To improve the ability of self diagnosis and external diagnosis in the system, the research of testability should be done,... View More

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