IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using Simulated Annealing Embedded Modified Gauss-Newton Algorithm to identify parameters of nonlinear degradation model

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Yao Jinyong ; Su Haibo ; Li Xiaogang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 10
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622225
Regular:

High accuracy parameter identification is important to the life prediction by the degradation model. In this paper, the Simulated Annealing Embed Modified Gauss-Newton (SAEMGN) Algorithm is... View More

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