IEEE - Institute of Electrical and Electronics Engineers, Inc. - Grain bags detection based on improved maximum between-cluster variance algorithm

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Yong Liu ; Sha Chen ; Ying Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 13
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622758
Regular:

The key to extracting the edge characteristics of grain bags in the grain reserve warehouse was image segmentation. In practice, the quality of the selected segmentation algorithm directly... View More

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