IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on fault-diagnosis models of different neural networks and ensemble

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Kun An
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 13
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622734
Regular:

Different diagnosis models, including multiplayer perceptron (MLP), radial basis function (RBF) and two types of support vector machines (SVMs), were designed, analyzed and compared based on the... View More

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