IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on fault-diagnosis models of different neural networks and ensemble
2010 International Conference on Computer Application and System Modeling (ICCASM 2010)
Author(s): | Kun An |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 October 2010 |
Conference Location: | Taiyuan, China, China |
Conference Date: | 22 October 2010 |
Volume: | 13 |
ISBN (Electronic): | 978-1-4244-7237-6 |
ISBN (Paper): | 978-1-4244-7235-2 |
DOI: | 10.1109/ICCASM.2010.5622734 |
Regular:
Different diagnosis models, including multiplayer perceptron (MLP), radial basis function (RBF) and two types of support vector machines (SVMs), were designed, analyzed and compared based on the... View More