IEEE - Institute of Electrical and Electronics Engineers, Inc. - Shock wave pressure testing two-channel storage

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Zhang Jian-xin ; Zhang He ; Zhou Xing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 14
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5622115
Regular:

According to the problem of low stable system, not high test circuit integration, unitary measured data,and data easy to lose in testing overpressure signal during the explosion,methods of stored... View More

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