IEEE - Institute of Electrical and Electronics Engineers, Inc. - Survivability assessment for command automation system based on Bayesian networks

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

Author(s): Xinhua He ; Rulin Hu ; Yingkun Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Taiyuan, China, China
Conference Date: 22 October 2010
Volume: 6
ISBN (Electronic): 978-1-4244-7237-6
ISBN (Paper): 978-1-4244-7235-2
DOI: 10.1109/ICCASM.2010.5620327
Regular:

To solve uncertainty and ambiguity of survivability assessment information of command automation system, this paper proposes one novel way of applying Bayesian networks to evaluate command... View More

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