IEEE - Institute of Electrical and Electronics Engineers, Inc. - Overshoot-controlled RLC interconnections

Author(s): J.R. Brews
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Volume: 38
Page Count: 12
Page(s): 76 - 87
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/16.65739
Regular:

How overshoot in the step response of a circuit involving an RLC line can be controlled using a combination of driver and line resistance that depends on the load capacitance is shown. The no-peak... View More

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