IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability Models

2010 Seventh International Conference on the Quantitative Evaluation of Systems (QEST)

Author(s): Leemis, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Williamsburg, VA, USA, USA
Conference Date: 15 September 2010
Page(s): 308
ISBN (Paper): 978-1-4244-8082-1
DOI: 10.1109/QEST.2010.46
Regular:

Performance modelers typically use Markov models associated with their analysis of computer systems. This tutorial introduces additional probabilistic models (e.g., competing risks, proportional... View More

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