IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modelling hysteretic phenomena in surface science

2010 IEEE 8th International Symposium on Intelligent Systems and Informatics (SISY 2010)

Author(s): Nemcsics, A. ; Takács, J. ; Bozsik, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Subotica, Serbia, Serbia
Conference Date: 10 September 2010
Page(s): 389 - 392
ISBN (CD): 978-1-4244-7395-3
ISBN (Electronic): 978-1-4244-7396-0
ISBN (Paper): 978-1-4244-7394-6
DOI: 10.1109/SISY.2010.5647387
Regular:

In this paper, the reflection high-energy electron diffraction (RHEED) intensity change against temperature in case of III-V surfaces is investigated. The reconstruction and other changes of the... View More

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