IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modelling hysteretic phenomena in surface science
2010 IEEE 8th International Symposium on Intelligent Systems and Informatics (SISY 2010)
| Author(s): | Nemcsics, A. ; Takács, J. ; Bozsik, J. |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 September 2010 |
| Conference Location: | Subotica, Serbia, Serbia |
| Conference Date: | 10 September 2010 |
| Page(s): | 389 - 392 |
| ISBN (CD): | 978-1-4244-7395-3 |
| ISBN (Electronic): | 978-1-4244-7396-0 |
| ISBN (Paper): | 978-1-4244-7394-6 |
| DOI: | 10.1109/SISY.2010.5647387 |
Regular:
In this paper, the reflection high-energy electron diffraction (RHEED) intensity change against temperature in case of III-V surfaces is investigated. The reconstruction and other changes of the... View More
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