IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fabric Defects Detection Method Using SAR Imaging

2010 6th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM)

Author(s): Long Zhang ; Xiao hui He ; Dong sen Si ; Hai-bin Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Chengdu City, China, China
Conference Date: 23 September 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-3709-2
ISBN (Paper): 978-1-4244-3708-5
DOI: 10.1109/WICOM.2010.5600892
Regular:

The existing fabric defection method mainly depend on the brightness of visual light or gray intensity of image, therefore, the effect of classification and identifition is deteriorated when the... View More

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