IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploratory failure analysis of open source software

2010 2nd International Conference on Software Technology and Engineering (ICSTE 2010)

Author(s): Rahmani, C. ; Srinivasan, S.M. ; Azadmanesh, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: San Juan, PR, USA, USA
Conference Date: 3 October 2010
Volume: 1
ISBN (Electronic): 978-1-4244-8666-3
ISBN (Paper): 978-1-4244-8667-0
DOI: 10.1109/ICSTE.2010.5608887
Regular:

Reliability growth modeling in software system plays an important role in measuring and controlling software quality during software development. One main approach to reliability growth modeling... View More

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