IEEE - Institute of Electrical and Electronics Engineers, Inc. - Approximate mean value analysis of airport sortie generation process on condition aircrafts launch in batches

2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering (CMCE 2010)

Author(s): Xia Guoqing ; Chen Hongzhao ; Wang Yuanhui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Changchun, China, China
Conference Date: 24 August 2010
Volume: 4
Page(s): 413 - 416
ISBN (CD): 978-1-4244-7955-9
ISBN (Electronic): 978-1-4244-7958-0
ISBN (Paper): 978-1-4244-7957-3
DOI: 10.1109/CMCE.2010.5610121
Regular:

Sortie generation rate (SGR) which means sustainable number of airport launches per period is a key factor of military aircraft's combat effectiveness. An approximate mean value analysis (MVA)... View More

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