IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cross Entropy Optimization of the Random Set Framework for Multiple Instance Learning

2010 20th International Conference on Pattern Recognition (ICPR 2010)

Author(s): Jeremy Bolton ; Paul Gader
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Istanbul, Turkey
Conference Date: 23 August 2010
Page(s): 3,907 - 3,910
ISBN (CD): 978-0-7695-4109-9
ISBN (Electronic): 978-1-4244-7541-4
ISBN (Paper): 978-1-4244-7542-1
ISSN (CD): 1051-4651
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2010.1114
Regular:

Multiple instance learning (MIL) is a recently researched technique used for learning a target concept in the presence of noise. Previously, a random set framework for multiple instance learning... View More

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