IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-supervised Distance Metric Learning by Quadratic Programming

2010 20th International Conference on Pattern Recognition (ICPR 2010)

Author(s): Hakan Cevikalp
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Istanbul, Turkey
Conference Date: 23 August 2010
Page(s): 3,352 - 3,355
ISBN (CD): 978-0-7695-4109-9
ISBN (Electronic): 978-1-4244-7541-4
ISBN (Paper): 978-1-4244-7542-1
ISSN (CD): 1051-4651
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2010.818
Regular:

This paper introduces a semi-supervised distance metric learning algorithm which uses pair-wise equivalence (similarity and dissimilarity) constraints to improve the original distance metric in... View More

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