IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Metrics for Shape Classification and Discrimination

2010 20th International Conference on Pattern Recognition (ICPR 2010)

Author(s): Yu Fan ; David Houle ; Washington Mio
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Istanbul, Turkey
Conference Date: 23 August 2010
Page(s): 2,652 - 2,655
ISBN (CD): 978-0-7695-4109-9
ISBN (Electronic): 978-1-4244-7541-4
ISBN (Paper): 978-1-4244-7542-1
ISSN (CD): 1051-4651
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2010.650
Regular:

We propose a family of shape metrics that generalize the classical Procrustes distance by attributing weights to general linear combinations of landmarks. We develop an algorithm to learn a metric... View More

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