IEEE - Institute of Electrical and Electronics Engineers, Inc. - The impact of patent trait upon firm performance in the American IC design industry: The role of the advantage of firm size

2010 Portland International Conference on Management of Engineering & Technology (PICMET)

Author(s): Yu-Shan Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Phuket, Thailand, Thailand
Conference Date: 18 July 2010
Page(s): 1 - 8
ISBN (CD): 978-1-890843-21-2
ISBN (Paper): 978-1-4244-8203-0
Regular:

This research explored the influence of patent profile upon firm performance via the advantage of firm size from the three patent indicators - number of annual new granted patents (NANGP),... View More

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