IEEE - Institute of Electrical and Electronics Engineers, Inc. - An analysis for Chinese patent competitiveness, through the USPTO database in 2008

2010 Portland International Conference on Management of Engineering & Technology (PICMET)

Author(s): Xiao-ping Lei ; Dar-Zen Chen ; Mu-Hsuan Huang ; Jia Zheng ; Zhi-Yun Zhao ; Xu Zhang ; Ze-Yu Zhang ; Yun-Hua Zhao ; Run-Sheng Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Phuket, Thailand, Thailand
Conference Date: 18 July 2010
Page(s): 1 - 10
ISBN (CD): 978-1-890843-21-2
ISBN (Paper): 978-1-4244-8203-0
Regular:

This article evaluates the competitiveness of China, during the period between 2004 and 2008, through patent performances of six technology fields, including the fields of Chemistry, Computer and... View More

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