IEEE - Institute of Electrical and Electronics Engineers, Inc. - Churn in Social Networks: A Discussion Boards Case Study

2010 IEEE Second International Conference on Social Computing (SocialCom)

Author(s): Karnstedt, M. ; Hennessy, T. ; Chan, J. ; Hayes, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 20 August 2010
Page(s): 233 - 240
ISBN (CD): 978-0-7695-4211-9
ISBN (Paper): 978-1-4244-8439-3
DOI: 10.1109/SocialCom.2010.40
Regular:

Churn has been identified as an important issue in a wide range of industries. In social networks, churn represents a significant risk for the health and functioning of communities. However, the... View More

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