IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Chinese Listed Company's Financial Crisis Based on SVM Classification

2010 International Conference on E-Business and E-Government (ICEE)

Author(s): Jun Zhu ; YanLi Su
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Guangzhou, China, China
Conference Date: 7 May 2010
Page(s): 2,487 - 2,490
ISBN (CD): 978-0-7695-3997-3
ISBN (Electronic): 978-1-4244-6647-4
DOI: 10.1109/ICEE.2010.628
Regular:

SVM based model is constructed for predicting performances of Chinese listed companies. The paper firstly uses factor analysis, equal value difference test and correlation test to sieve the... View More

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