IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determinants of Chinese Exhibitor Satisfaction and Re-attend Intention

2010 International Conference on E-Business and E-Government (ICEE)

Author(s): Yingkang Gu ; Jie Yang ; Xiuli Tang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Guangzhou, China, China
Conference Date: 7 May 2010
Page(s): 3,025 - 3,028
ISBN (CD): 978-0-7695-3997-3
ISBN (Electronic): 978-1-4244-6647-4
DOI: 10.1109/ICEE.2010.763
Regular:

This research used factor analysis to explore the underlying factors that might affect the satisfaction level and re-attend intention of Chinese exhibitors to an exhibition, and then utilized... View More

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