IEEE - Institute of Electrical and Electronics Engineers, Inc. - Derivation of stress severities in wheat from hyperspectral data using support vector regression

2010 2nd Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS)

Author(s): Mewes, T. ; Waske, B. ; Franke, J. ; Menz, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Reykjavik, Iceland, Iceland
Conference Date: 14 June 2010
Page(s): 1 - 4
ISBN (Electronic): 978-1-4244-8907-7
ISBN (Paper): 978-1-4244-8906-0
DOI: 10.1109/WHISPERS.2010.5594921
Regular:

The benefits and limitations of crop stress detection by hyperspectral data analysis have been examined in detail. It could thereby be demonstrated that even a differentiation between healthy and... View More

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