IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectral Angle Mapper classification of fluorescence hyperspectral image for aflatoxin contaminated corn

2010 2nd Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS)

Author(s): Haibo Yao ; Hruska, Z. ; Kincaid, R. ; Ononye, A. ; Brown, R.L. ; Cleveland, T.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2010
Conference Location: Reykjavik, Iceland, Iceland
Conference Date: 14 June 2010
Page(s): 1 - 4
ISBN (Electronic): 978-1-4244-8907-7
ISBN (Paper): 978-1-4244-8906-0
DOI: 10.1109/WHISPERS.2010.5594920
Regular:

Aflatoxin contamination in corn is a serious problem for both producers and consumers. The present study applied the Spectral Angle Mapper classification technique to classify single corn kernels... View More

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