IEEE - Institute of Electrical and Electronics Engineers, Inc. - Probabilistic Model of System Survivability

2010 4th IEEE International Symposium on Theoretical Aspects of Software Engineering (TASE)

Author(s): Yongxin Zhao ; Yanhong Huang ; Jianwen Li ; Huibiao Zhu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 25 August 2010
Page(s): 193 - 200
ISBN (Paper): 978-1-4244-7847-7
DOI: 10.1109/TASE.2010.15
Regular:

The paper completely formalizes the concept of system survivability on the basis of Knight's research in \cite{Knight03}. We present a computable probabilistic model of survivable system which is... View More

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