IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Improved Algorithm for Building the Characterizing Set

2010 4th IEEE International Symposium on Theoretical Aspects of Software Engineering (TASE)

Author(s): Huaikou Miao ; Pan Liu ; Jia Mei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Taipei, Taiwan, Taiwan
Conference Date: 25 August 2010
Page(s): 67 - 74
ISBN (Paper): 978-1-4244-7847-7
DOI: 10.1109/TASE.2010.14
Regular:

FSM-based testing can obviously reduce the cost of test generation. So many FSM-based test generation methods have been presented to generate effective test sequences. Most of them need to... View More

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