IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Duo-TIN fault data model for mine 3D GIS

2010 Second IITA International Conference on Geoscience and Remote Sensing (IITA-GRS 2010)

Author(s): Runhuai Wang ; Qiang Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Qingdao, China, China
Conference Date: 28 August 2010
Volume: 1
Page(s): 141 - 145
ISBN (CD): 978-1-4244-8516-1
ISBN (Electronic): 978-1-4244-8517-8
ISBN (Paper): 978-1-4244-8514-7
DOI: 10.1109/IITA-GRS.2010.5603004
Regular:

Fault object is an important structural element in geology body. Constructing the independent fault data model has a significant sense for mine 3D GIS because the fundamental functionalities such... View More

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