IEEE - Institute of Electrical and Electronics Engineers, Inc. - MODIS-NDVI-Based crop growth monitoring in China Agriculture Remote Sensing Monitoring System

2010 Second IITA International Conference on Geoscience and Remote Sensing (IITA-GRS 2010)

Author(s): Huang Qing ; Zhang Li ; Wu Wenbin ; Li Dandan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Qingdao, China, China
Conference Date: 28 August 2010
Volume: 2
Page(s): 287 - 290
ISBN (CD): 978-1-4244-8516-1
ISBN (Electronic): 978-1-4244-8517-8
ISBN (Paper): 978-1-4244-8514-7
DOI: 10.1109/IITA-GRS.2010.5603948
Regular:

Crop growth monitoring timely and accurately during the growing season is of great importance for accurate yield estimation, which can provide information support for making and adjusting... View More

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