IEEE - Institute of Electrical and Electronics Engineers, Inc. - Financial distress model prediction using SVM+

2010 International Joint Conference on Neural Networks (IJCNN)

Author(s): Ribeiro, B. ; Silva, C. ; Vieira, A. ; Gaspar-Cunha, A. ; das Neves, J.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 July 2010
Page(s): 1 - 7
ISBN (CD): 978-1-4244-6917-8
ISBN (Electronic): 978-1-4244-6918-5
ISBN (Paper): 978-1-4244-6916-1
ISSN (CD): 1098-7576
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2010.5596729
Regular:

Financial distress prediction is of great importance to all stakeholders in order to enable better decision-making in evaluating firms. In recent years, the rate of bankruptcy has risen and it is... View More

Advertisement