IEEE - Institute of Electrical and Electronics Engineers, Inc. - Software defect prediction using static code metrics underestimates defect-proneness

2010 International Joint Conference on Neural Networks (IJCNN)

Author(s): Gray, D. ; Bowes, D. ; Davey, N. ; Yi Sun ; Christianson, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Barcelona, Spain, Spain
Conference Date: 18 July 2010
Page(s): 1 - 7
ISBN (CD): 978-1-4244-6917-8
ISBN (Electronic): 978-1-4244-6918-5
ISBN (Paper): 978-1-4244-6916-1
ISSN (CD): 1098-7576
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2010.5596650
Regular:

Many studies have been carried out to predict the presence of software code defects using static code metrics. Such studies typically report how a classifier performs with real world data, but... View More

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