IEEE - Institute of Electrical and Electronics Engineers, Inc. - Waveform design for low frequency tomography

2010 International Waveform Diversity and Design Conference (WDD)

Author(s): Sego, D.J. ; Griffiths, H. ; Wicks, M.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Conference Location: Niagara Falls, ON, Canada, Canada
Conference Date: 8 August 2010
Page(s): 230 - 237
ISBN (CD): 978-1-4244-8200-9
ISBN (Electronic): 978-1-4244-8201-6
ISBN (Paper): 978-1-4244-8202-3
ISSN (CD): 2150-4652
ISSN (Paper): 2150-4652
DOI: 10.1109/WDD.2010.5592595
Regular:

There are multiple applications that would benefit from the ability to produce three dimensional, high resolution, imagery collected at low operating frequency; among them remote archeological... View More

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