IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enumeration based reliability assessment algorithm considering nodal uncertainties

2010 IEEE Power & Energy Society General Meeting

Author(s): Gaun, A. ; Rechberger, G. ; Renner, H. ; Lehtonen, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 25 July 2010
Page(s): 1 - 8
ISBN (CD): 978-1-4244-6550-7
ISBN (Electronic): 978-1-4244-6551-4
ISBN (Paper): 978-1-4244-6549-1
ISBN (Online): 978-1-4244-8357-0
ISSN (CD): 1944-9925
ISSN (Paper): 1944-9925
ISSN (Online): 1944-9925
DOI: 10.1109/PES.2010.5589268
Regular:

A novel fast enumeration based reliability assessment algorithm based on a probabilistic load flow approach considering nodal uncertainties is proposed in this paper. The frequency and duration... View More

Advertisement