IEEE - Institute of Electrical and Electronics Engineers, Inc. - A transient monitor to reflect the quality of synchrophasors

2010 IEEE Power & Energy Society General Meeting

Author(s): Sodhi, R. ; Srivastava, S.C. ; Singh, S.N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Minneapolis, MN, USA, USA
Conference Date: 25 July 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-6550-7
ISBN (Electronic): 978-1-4244-6551-4
ISBN (Paper): 978-1-4244-6549-1
ISBN (Online): 978-1-4244-8357-0
ISSN (CD): 1944-9925
ISSN (Paper): 1944-9925
ISSN (Online): 1944-9925
DOI: 10.1109/PES.2010.5588199
Regular:

The evolving synchrophasor standards under transient condition may stipulate the phasor measurements to carry information regarding the quality of measurements in addition to the time stamp. This... View More

Advertisement