IEEE - Institute of Electrical and Electronics Engineers, Inc. - Active compensation for critical coupling deviation on a single-arm silicon microring by free-carrier absorption

2010 15th OptoeElectronics and Communications Conference (OECC)

Author(s): Chih-T'sung Shih ; Shiuh Chao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Sapporo, Japan, Japan
Conference Date: 5 July 2010
Page(s): 694 - 695
ISBN (CD): 978-4-88552-246-8
ISBN (Electronic): 978-4-88552-246-8
ISBN (Paper): 978-1-4244-6785-3
Regular:

We present active critical coupling compensation by employing the free-carrier absorption for a single-arm silicon microring device when the microring has fabrication error to deviate from... View More

Advertisement