IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reconstruction of refractive index profiles using differential near-field measurement

2010 15th OptoeElectronics and Communications Conference (OECC)

Author(s): Tsai, W.-S. ; Wei, P.-K. ; Wang, W.-S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Sapporo, Japan, Japan
Conference Date: 5 July 2010
Page(s): 312 - 313
ISBN (CD): 978-4-88552-246-8
ISBN (Electronic): 978-4-88552-246-8
ISBN (Paper): 978-1-4244-6785-3
Regular:

Two-dimensional index profile reconstruction with differential near-field images measured by end-fire coupling is presented. Single mode fiber with a step-index profile measured at 632.8nm is... View More

Advertisement