IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical effects of avalanche CMOS photodiodes

2010 15th OptoeElectronics and Communications Conference (OECC)

Author(s): Chieh Ning Chan ; Chen, O.T.-C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Sapporo, Japan, Japan
Conference Date: 5 July 2010
Page(s): 824 - 825
ISBN (CD): 978-4-88552-246-8
ISBN (Electronic): 978-4-88552-246-8
ISBN (Paper): 978-1-4244-6785-3
Regular:

Three photodiodes of P-diffusion_N-well_P-substrate, N-well_P-substrate, N-diffusion_P-substrate photodiodes using the TSMC 0.35μm CMOS technology are implemented to understand... View More

Advertisement