IEEE - Institute of Electrical and Electronics Engineers, Inc. - SRS microscopy as a low-invasive 3D bioimaging technique

2010 9th Euro-American Workshop on Information Optics (WIO)

Author(s): Itoh, K. ; Ozeki, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Helsinki, Finland, Finland
Conference Date: 12 July 2010
Page(s): 1 - 3
ISBN (Electronic): 978-1-4244-8227-6
ISBN (Paper): 978-1-4244-8226-9
DOI: 10.1109/WIO.2010.5582519
Regular:

We introduce stimulated Raman scattering microscopy which allows us to visualize unstained live cells with high sensitivity and high contrast. The shot-noise limited sensitivity can be achieved... View More

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