IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single beam computational 3D microscopy

2010 9th Euro-American Workshop on Information Optics (WIO)

Author(s): Anand, A. ; Javidi, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Helsinki, Finland, Finland
Conference Date: 12 July 2010
Page(s): 1 - 3
ISBN (Electronic): 978-1-4244-8227-6
ISBN (Paper): 978-1-4244-8226-9
DOI: 10.1109/WIO.2010.5582508
Regular:

Three dimensional microscopy allows the reconstruction of both phase and amplitude of the object wavefronts. This in turn sheds information on the optical path length profile of the object.... View More

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