IEEE - Institute of Electrical and Electronics Engineers, Inc. - Different approaches to increase resolution in DHM

2010 9th Euro-American Workshop on Information Optics (WIO)

Author(s): Faridian, A. ; Hopp, D. ; Pedrini, G. ; Osten, W. ; Eigenthaler, U. ; Hirscher, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Helsinki, Finland, Finland
Conference Date: 12 July 2010
Page(s): 1 - 3
ISBN (Electronic): 978-1-4244-8227-6
ISBN (Paper): 978-1-4244-8226-9
DOI: 10.1109/WIO.2010.5582503
Regular:

Different approaches to increase the resolution in digital holographic microscopy (DHM) are presented. A high resolution approach has been implemented in the off axis Deep UV DHM setup using... View More

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