IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metric Data Analysis Enhanced through Temporal Visualization

2010 14th International Conference Information Visualisation (IV)

Author(s): Bueno, R. ; Razente, H.L. ; Kaster, D.S. ; Barioni, M.C.N. ; Traina, A.J.M. ; Traina, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: London, TBD, United Kingdom, United Kingdom
Conference Date: 26 July 2010
Page(s): 116 - 121
ISBN (Paper): 978-1-4244-7846-0
ISSN (Paper): 1550-6037
DOI: 10.1109/IV.2010.26
Regular:

The human vision can naturally interpret data in spaces of 2 or 3 dimensions. When data is in higher dimensional spaces, in most cases the visualization is not intuitive. Regarding metric spaces,... View More

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